Bagatin, M.E., Gerardin, S. (Ed.), Ionizing Radiation Effects in Electronics, Boca Raton, 2016:.
 Hönniger, F., Radiation damage in silicon: Defect analysis and detector properties. 2008, (Hamburg U.). p. 187.
 Shoorian, S., Jafari, H. and Feghhi, S.A.H., "Investigating and Calculating of Silicon Displacement defect due to irradiation on Photodiodes Using Carrier Lifetime Changes," 25th ICOP and 11th ICEPT, 2019.
 Srour, J.R., Marshall, C.J. and Marshall, P.W., "Review of Displacement Damage Effects in Silicon Devices," IEEE Transactions on Nuclear Science, Vol. 50, Issue. 3, 2003, pp. 653 - 670.
 Dale, C.J., et al., "A comparison of Monte Carlo and analytic treatments of displacement damage in Si microvolumes." IEEE Transactions on Nuclear Science, Vol. 41, No. 6, 1994, pp. 1974-1983.
 Messenger, S.R., Xapsos, M.A., Burke, E.A., Walters, R.J. and Summers, G.P., "Proton Displacement Damage and Ionizing Dose for Shielded Devices in Space," IEEE Transactions on Nuclear Science, Vol. 44, Issue. 6, 1997, pp. 2169 - 2173.
 Summers,G.P., Burke, E.A., Shapiro, P., Messenger, S.R., and Walters, R.J., "Damage correlations in semiconductors exposed to gamma, electron and proton radiations," IEEE Transactions on Nuclear Science, Vol. 40, No. 6, 1993, pp. 1372-1379.
 Jun, I., Xapsos, M.A., Messenger, S.R., Burke, E.A., Walters, R.J., Summers, G.P. and Jordan, T., "Proton nonionizing energy loss (NIEL) for device applications," IEEE Transactions on Nuclear Science, Vol. 50, No. 6, 2003, pp. 1924-1928.
 Srour, J.R. and Palko, J.W., "A Framework for Understanding Displacement Damage Mechanisms in Irradiated Silicon Devices," IEEE Transactions on Nuclear Science, Vol. 53, No. 6, 2006, pp. 3610-3620.
Li, H. and et al., "The evolution of interaction between grain boundary and irradiation-induced point defects: Symmetric tilt GB in tungsten," Journal of Nuclear Materials, Vol. 500, 2018, pp. 42-49.
 Shoorian, S., Jafari, H. and Feghhi, S.A.H., "Investigating and calculating the leakage current of silicon diode exposed to sputtering of protons using carrier lifetime changes," 25th Iranian Nuclear Conference, 2020.
OMERE website. Available, [on line]: http://www.trad. fr/OMERE-Software.html.
User manual of Silvaco ATLAS– Device Simulation Software [online documents], Silvaco Inc. 2013.
Agostinelli, S. and et al othetrs, "GEANT4 - a simulation toolkit," Nucl. Instr. Meth.A, Vol. 506, No. 3, pp. 250-303.
Silvaco International, ATLAS User's Manual (vol I & II), 1998.
James F., Ziegler, M. D. and Biersack, J. P. Ziegler, M. D., Biersack, J. P., SRIM - "The stopping and range of ions in matter,"Nuclear Instruments and Methods in Physics Research Section B, Vol. 268, Issue 11-12, 2010, pp. 1818-1823.
 Shockley, W. and W.T. Read, "Statistics of the Recombinations of Holes and Electrons," Physical Review, Vol. 8, No. 5, 1952, pp. 835-842.
 Dowell, J.D.H., Kenyon, R. J., Mahout, I. R. and et al. "Irradiation tests of photodiodes for the ATLAS SCT readout," Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 424, No. 2-3, 1999, pp. 483-494.
Akkerman, A. and et al., "Updated NIEL calculations for estimating the damage induced by particles and γ-rays in Si and GaAs," Radiation Physics and Chemistry, Vol. 62, No. 4, 2001, pp. 301-310.
 Jafari, H. and Feghhi, S.A.H., "Analytical modeling for gamma radiation damage on silicon photodiodes," Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 816, 2016, pp. 62-69.
Thomas L. Floyd, Y.Y., Yanhui Zhang, Electronic Devices. 8th ed. April 6th 2007: Prentice Hall.
 S. Sedra, A. and C.Smith, K., Microelectronic Circuits, USA: Oxford University Press, 2003, p. 1392.
 Abarbakooh, A. L. and et al., Measurement of proton energy output from C-30 cyclotron in Karaj, Master’s Thesis, K. N. Toosi University of Technology, 2002 (in persian)
 Topper, A.D. and et al., "Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program," To be published in the Institute of Electrical and Electronics Engineers (IEEE) Nuclear and Space Radiation Effects Conference (NSREC), Radiation Effect Data Workshop proceedings, New Orleans, Louisiana, July 17-21, 2017.