Ö. Amutkan, "Space Radiation Environment and Radiation Hardness Assurance Tests of Electronic Components to be Used in Space Missions," [Thesis PhD] Submitted to the Graduate School of Natural and Applied Sciences of Middle East Technical University, 2010.
 E. G. Stassinopoulos and J. P. Raymond, "The Space Radiation Environment for Electronics", Proceedings of the. IEEE, Vol. 76, No. 11, pp. 1423–1442, 1988, doi: 10.1109/5.90113.
 “ESA ESA and Space Debris”, European Space Agency. https://www.esa.int/About_Us/ESA_Publications/ESA_Publications_Brochures/ESA_BR309_ESA_and_Space_Debris.
 J. R. Schwank, M. R. Shaneyfelt, and P. E. Dodd, "Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Radiation Environments, Physical Mechanisms, and Foundations for Hardness Assurance", IEEE Transactions on Nuclear Science., Vol. 60, No. 3, pp.2074–2100, 2013, doi:10.1109/TNS.2013. 2254722.
 ECSS, “Space Product Assurance - Software Product Assurance”, ESA, 1996.
 ECSS, Space product Assurance Radiation Hardness Assurance, in ESA-TEC-QE/2009/22, ESA, 2009.
 Moore A, and Jimenez J. GaN RF Technology for Dummies. TriQuint Special Edition Published by John Wiley & Sons, Inc. 111 2015.
 K Bernard, "Advantages of Using Gallium Nitride FETs in Satellite Applications", White Paper, Renensas, February, Tokyo, Japan 2018.
 J. Haiwei, L. Qin, L. Zhang, and et al., "Review of Wide Band-Gap Semiconductors Technology", in MATEC Web of Conferences, Vol.40, p. 01006, EDP Sciences 2016, DOI: 10.1051/matecconf/ 20164001006.
 S.J Pearton, F. Ren, E. Patrick, and et al. "Review – Ionizing Radiation Damage Effects on GaN Devices", ECS J.Solid State Sci. Technol. Vol. 5, No. 2, pp.35-60, 2016
 K. Hirche et al., “GaN Reliability Enhancement and Technology Transfer Initiative (GREAT2)”, Abstr. ESA/ESTEC Contract No. 21.499/08/ NL/PA.,Vol. 21, No. 8, 2014.
 A. Y. Polyakov, S. J. Pearton, P. Frenzer, F. Ren, L. Liu, a/ac J. Kim, “Radiation Effects in GaN Materials and Devices”, yn Journal of Materials Chemistry C, 2013, Vol. 1, No. 5, pp. 877–887, doi: 10.1039/c2tc00039c.
 A. C. Vilas Bôas et al., “Ionizing Radiation Hardness Tests of GaN HEMTs for Harsh Environments”, Microelectron. Reliab., Vol. 116, 2021, doi: 10.1016/j.microrel.2020.114000.
 ECSS, “Methods for the Calculation of Radiation Received and Its Effects, and a Policy for Design Margins”, Ecss-E-St-10-12C, Vol. November, pp. 1–218, 2008.
 R. Omidi , K. Mohammadi, “ SEU Rate and Reliability Analysis in LEO Satellites”, J. Sp. Sci. Technol., Vol. 5, No. 3, pp. 1–9, 2012,
 A. Esmaelian, S. Amirhossin feghhi, H. Jafari and A. Pahlavan , “Studying and Calculating the Radiation Damage Caused by the Solar Radiation Spectrum in the Crystal Structure of Semiconductor Components”, J. Sp. Sci. Technol., Vol. 6, No. 16, pp. 55–60, 2013.
 H. Daneshvar, M. Khoshsima and A. Dayani, “Study of Modeling Parameters in Determination of TID, DD, and SEE Radiation Damages for Satellite in LEO Orbit Using OMERE Software”, J. Sp. Sci. Technol., Vol. 12, No. 40, pp. 63–71, 2019.
 H. Daneshvar, K. Gh. Milan, A. Sadri, S. H. Sedighy, Sh. Malekie and A. Mosayebi, “Multilayer Radiation Shield for Satellite Electronic Components Protection”, Nature Scientifc Reports, Vol. 11, pp. 1-12, 2021.
 K. Gh. Milan, A. Sadri, S. H. Sedighy and H. Daneshvar, “Analysis, Design and Optimization of the Multi Layer Radiation Shielding of Satellite Electronic Components”, J. Sp. Sci. Technol., Vol. 4, No. 2, pp. 71–76, 2021.
 M. Mokhtari et al., “Experimental Study of the Effect of Using Space Sandwich Structures for Protection Against Space Radiation”, J. Sp. Sci. Technol., Accepted Manuscript Available Online from 21 September 2021.
 ESA ESCC Basic Specification No. 22900, “Total dose steadystate irradiation test method”, issue 4, October 2010.
 ESA ECSS, “ECSS-Q-ST-60-15C Radiation Hardness Assurance - EEE Components”, ECSS Secretariat, Vol. October. No. 32, 2012.
 ECSS-E-ST-10-12C– Methods for The Calculation of Radiation Received and Its Effects and A Policy for Design Margins, (15 November 2008) + “Identified typographical error,” This Standard is Supported by ECSS Handbook:ECSS-E-HB-10-12A (17 December 2010).
 ECSS, Space product Assurance Radiation Hardness Assurance - EEE components for JUICE, in ESA-TEC-Q/2012/155, ESA, 2012.
 D. Custodian a/ac E. S. Agency, "Total Dose Steady-State Irradiation Test Method ESCC Basic Specification No . 22900”, Test, No. 22900. ESCC, pp. 1–17, 2007.
 A. Varotsou, "OMERE Space Radiation Environment and Effects Tool: New Developments and New Interface", 2017.
 H. Daneshvar, A. Eidi, L. Mohamadi, R. Omidi, P. Hajipour, "Investigation and Feasibility Study of Using Components with Different Categories from the Perspective of Radiation Damage in LEO and GEO Orbits", J. Sp. Sci. Technol., Vol. 14, No. 4, pp. 11–23, 2021.
 Y. Ye et al., “The Secular Variation of the Center of Geomagnetic South Atlantic Anomaly and Its Effect on the Distribution of Inner Radiation Belt Particles”, Sp. Weather, Vol. 15, No. 11, 2017, doi: 10.1002/2017SW001687.
 H. Daneshvar, “Calculation of Radiation Damage on Electronic Devices”, Shahid Beheshti University, 2011.
 M. Poizat, “Radiation Environment and its Effects in EEE. Components and Hardness Assurance for Space. Application”, yn Radiation environment and its effects in EEE components and hardness assurance for space applications, 2017.
 F. W. Sexton, “Measurement of Single-Event Phenomena in Devices and ICs”, 1992.
 “Integrated Circuits (Microcircuits) Manufacturing, General Specification for”, MIL, 2002.
 S. Division, “Space Product Assurance Radiation Hardness Assurance”, 2012.
 Jet Propulsion Laboratory, “Radiation Design Margin Requirement”, NASA, 1999. [Arlein]. Ar gael: http://llis.nasa.gov/lesson/792.