Reza Omidi Gosheblagh; Karim Mohammadi
Volume 5, Issue 3 , October 2012, , Pages 1-9
Abstract
Due to high design and launch cost of satellites, their failure probability should be minimized. Single Event Effects (SEUs) are one of the most common error sources in satellite microelectronic. To cope with these unwanted errors, various techniques are used. The reliability analysis of these methods ...
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Due to high design and launch cost of satellites, their failure probability should be minimized. Single Event Effects (SEUs) are one of the most common error sources in satellite microelectronic. To cope with these unwanted errors, various techniques are used. The reliability analysis of these methods is one of the major acceptance criteria to validate these techniques. In order to evaluate the reliability of satellite subsystems, it is required to determine the SEU rate as a primary factor. A practical method to determine this rate is based on Weibull approach in which the SEU cross section is used as an initialized parameter. In this paper, the SEU rate is calculated based on weibull method for Low Earth Orbit (LEO) satellites, as case study Iranian demonstrated Rasad and Omid satellites. Furthermore, based on the proton density, an accurate time-varying SEU rate model is proposed which determines the rejuvenation time for SEU susceptible subsystems.
