investigating space radiation
Sara Shoorian; Hamid Jafari; S. Amir Hossein Feghhi; Gholamreza Aslani
Volume 13, Issue 4 , December 2020, , Pages 71-79
Abstract
The presence of ionizing radiation in the space environment, due to trapped particles, solar particles and cosmic rays can be a serious threat to the proper functioning of electronic components used in satellites and spacecraft. In this work, the leakage current variation of a silicon diode, as the basic ...
Read More
The presence of ionizing radiation in the space environment, due to trapped particles, solar particles and cosmic rays can be a serious threat to the proper functioning of electronic components used in satellites and spacecraft. In this work, the leakage current variation of a silicon diode, as the basic element of many electronic components, has been investigated in the exposure of space protons. For this purpose, the GEANT4 Monte Carlo code has been used to calculate the non-ionizing energy loss in the device. The simulation of electrical parameters for irradiation of space protons were also done by SILVACO software. The results show that the leakage current increases by about 1.85 times the amount of it before irradiation, up to about 96.2 nA/μm by the increase in the proton flux up to 2.1×1012 p/cm2. Irradiation of BPW34 photodiodes under 30 MeV protons was performed to validate the results of simulation.
S. Boorboor; S. A. H. Feghhi; H. Jafari
Volume 6, Issue 4 , January 2014, , Pages 23-28
Abstract
Shape and size of sensitive volume are the most important parameters to model electronic devices for calculation of the SEU rate from space radiations. So far different models have been proposed for estimation of the sensitive volume. In this work, results of three models including RPP, Tetrahedral and ...
Read More
Shape and size of sensitive volume are the most important parameters to model electronic devices for calculation of the SEU rate from space radiations. So far different models have been proposed for estimation of the sensitive volume. In this work, results of three models including RPP, Tetrahedral and Nested in calculation of sensitive volume have been compared with experimental result for AT60142 SRAM. GEANT4 as a Monte Carlo code has been used to calculate energy loss and energy straggling of ions with considering metallization and oxide layers. Comparisons between Monte Carlo and experimental results shows that RPP model estimates the SEU cross section with a large deviation in whole LET range, tetrahedral has good response in low LET's but don't follow experimental result for high LET particles and nested sensitive volume produce acceptable results for whole of LET range.
