investigating space radiation
Hamideh Daneshvar; Azam Eidi; Leila Mohamadi; Reza Omidi; Pedram Hajipour
Volume 14, Issue 4 , December 2021, , Pages 11-23
Abstract
Space radiation can affect the performance and reliability of components in space systems. This paper focuses on the investigation of three types of radiation damage including ionizing dose, displacement damage, and single event damage using OMERE software. Considering the outputs of this software, how ...
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Space radiation can affect the performance and reliability of components in space systems. This paper focuses on the investigation of three types of radiation damage including ionizing dose, displacement damage, and single event damage using OMERE software. Considering the outputs of this software, how to use and use a variety of electronic components with different commercial, military and space grades in LEO and GEO satellites is discussed. These components have the least risk of displacement damage. Mass budget constraints should also be considered when using commercial components in the GEO circuit. The maximum thickness for the safety of components in LEO and GEO circuits is 2.6 mm and 9.5 mm respectively. Given the inability of SEE damage to increase in thickness, the best solution to this damage is to use radiation-resistant solutions, especially software issues.
investigating space radiation
Sara Shoorian; Hamid Jafari; S. Amir Hossein Feghhi; Gholamreza Aslani
Volume 13, Issue 4 , December 2020, , Pages 71-79
Abstract
The presence of ionizing radiation in the space environment, due to trapped particles, solar particles and cosmic rays can be a serious threat to the proper functioning of electronic components used in satellites and spacecraft. In this work, the leakage current variation of a silicon diode, as the basic ...
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The presence of ionizing radiation in the space environment, due to trapped particles, solar particles and cosmic rays can be a serious threat to the proper functioning of electronic components used in satellites and spacecraft. In this work, the leakage current variation of a silicon diode, as the basic element of many electronic components, has been investigated in the exposure of space protons. For this purpose, the GEANT4 Monte Carlo code has been used to calculate the non-ionizing energy loss in the device. The simulation of electrical parameters for irradiation of space protons were also done by SILVACO software. The results show that the leakage current increases by about 1.85 times the amount of it before irradiation, up to about 96.2 nA/μm by the increase in the proton flux up to 2.1×1012 p/cm2. Irradiation of BPW34 photodiodes under 30 MeV protons was performed to validate the results of simulation.
A. Hosseini; S. A. Feghhi; H. Jafari; M.B Aghaei
Volume 6, Issue 2 , July 2013, , Pages 11-19
Abstract
When the electronic components are exposed to neutron irradiation, electrical properties change by interaction of neutrons in these parts such as capacitance, reverse bias current, the minority carrier lifetime, etc. These changes are very important, so that may impair the performance of the device and ...
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When the electronic components are exposed to neutron irradiation, electrical properties change by interaction of neutrons in these parts such as capacitance, reverse bias current, the minority carrier lifetime, etc. These changes are very important, so that may impair the performance of the device and disable it. So the measurement of the damage by neutrons in these parts is necessary. One of the most important parameters for expressing the damage to electronic components is a constant, α that is the inverse current of the damage.The constant (α) is the slope of the reverse current curve versus the radiation flux. The aim of this work is measurement of the damage reverse current of constant α for diodes 1N4007, BYV27 and BYV95 in various voltages and temperatures.These diodes have been irradiated at the Tehran Research Reactor by fission neutron spectrum.The results are in good agreement with the theoretical relations.
